Replication Data for: "SMaRT Stacking: a Methodology to Produce Optimally Layered EMI Shields with Maximal Green Index using Fused Deposition Modeling"
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资源简介：
Measurements of S-parameters obtained with a Vector Network Analyzer (VNA) in the X-band frequency range (8 - 12 GHz) to train the permittivity function of PLA/MWCNT nanocomposites produced via Fused Deposition Modeling (FDM). VNA measurements of the optimal stacks are also included.
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KU Leuven RDR创建时间：
2025-07-09
