Related data of Neural Network Model for Predicting Thin-Film Structural Parameters Based on X-Ray Reflectivity Curve Features
收藏DataCite Commons2026-02-05 更新2026-05-05 收录
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Related data of Neural Network Model for Predicting Thin-Film Structural Parameters Based on X-Ray Reflectivity Curve Features.Including Structure of films,. Heatmap of Spearman Correlation Coefficients Between Thin Film Parameters and XRR Curve Feature Parameters and so on.
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Science Data Bank
创建时间：
2026-02-05
