Data collection and refinement statistics on the apo and complex structures of TS_VZV.

a The values in the parentheses are for the highest resolution shell (3.1–3.2 Å). b The values in the parentheses are for the highest resolution shell (2.9–3.0 Å). cRmerge=[∑hkl∑i|Ii(hkl)−I¯(hkl)|][∑hkl∑iI¯(hkl)]×100, where Ii is the ith intensity measurement of reflection hkl, Ī(hkl) is the mean intensity measurement of the symmetry related or replicated reflections of the unique reflection hkl. dRfactor=[∑hkl|Fobs(hkl)−Fcalc(hkl)|][∑hklFobs(hkl)]×100, where Fobs and Fcalc are the observed and calculated structure factors respectively. e Rfree is equivalent to Rfactor but 5% of the measured reflections have been excluded from refinement and set aside for cross validation. Data collection and refinement statistics on the apo and complex structures of TSVZV.