Silicon in graphene - electron beam position dependent statistics

This data is in the form of a many sets of (image + corresponding beam position). This data originates from medium-angle annular dark field (MAADF) electron scattering in the scanning transmission electron microscope (STEM), where the material system is single layer graphene with single silicon substitutional dopant atoms. Therefore, the logic is to determine the ideal beam location relative to the silicon atom with the intention of driving the silicon in a particular location. Five different agents are used to direct the position of the electron beam relative to the silicon atom in this data-driven approach, listed by their zip file names in this collection of Datasets.