supplementary Material

See the supplementary material for the surface and cross-sectional SEM images, relative density and grain size statistics (FIG. S1), Rietveld refinement results (FIG. S2), enlarged out-of-plane PFM phase images for x = 0.050 (FIG. S3), Tm as a function of x (FIG. S4), fitting of γ and γ as a function of x (FIG. S5), Weibull distributions of Eb (FIG. S6), comparison of Wrec and η values of x = 0.125 ceramics with some recently reported ceramic systems) (FIG. S7), XPS O 1s spectra and the corresponding fitting of oxygen vacancy concentration (FIG. S8), refined structural parameters (TABLE S1), and comparison in the temperature stability of the x = 0.125 sample with some recently reported ceramic systems (TABLE S2).