Author-created evidence package for From prediction scores to production actions: inspection and discarding policy selection in semiconductor and injection-moulding manufacturing

Code, derived results and the files referenced in the supplementary material for the manuscript "From prediction scores to production actions: inspection and discarding policy selection in semiconductor and injection-moulding manufacturing" by Yong Hee Han. Third-party raw datasets and source-paper full texts are not redistributed; they remain available from their original providers. Code is MIT-licensed; author-created documents and results are CC BY 4.0. See README.md and LICENSE inside the archive.