Strain evolution at metal-oxide interface of self-assembled in-plane nanowire with metal-tip and oxide-stem structure during melting of meta

Surface and interface of Indium tin oxide (ITO) nanowires (NWs) with Sn tips are model systems to understand how in-plane oxide NWs were grown via vapor-liquid-solid method (VLS). So far, TEM studies have reported the atomic arrangement and interfacial structure of the Sn tip and ITO stem, but details of the growth mechanism are still unclear which can lead to fabrication of improved devices. Coherent nanobeam X-ray diffraction together with a 3D visualization of individual ITO NWs with Sn tips by Bragg ptychography will provide insight into the Young’s equation related to the balance among the interfacial tensions involved in the VLS growth of horizontal NWs. In addition, in-situ studies will provide important clues to understand the evolution of atomic arrangements during the early stages of surface melting of metal nanocrystals.