Supporting data for "Stability of lead- and tin- based perovskite"

This research generates a comprehensive dataset focused on the stability of metal halide perovskites under environmental stress. The data primarily encompasses material characterization and device performance measurements for both 3D and 2D perovskite systems, with and without strategic additive engineering.The core data includes:<b>Thin-film characterization:</b> Extensive data from X-ray diffraction (XRD) for phase structure, scanning electron microscopy (SEM) for morphology, Fourier-transform infrared spectroscopy (FTIR) for chemical group analysis, and UV-Vis spectroscopy for optical properties. These datasets track material evolution and degradation.<b>Device performance and stability:</b> Current-voltage (I-V) characterization data for perovskite solar cells, providing power conversion efficiency (PCE) and other photovoltaic parameters. Critically, this includes time-series I-V data recorded over hundreds of hours under continuous operation in high-humidity environments to quantify stability.<b>Comparative degradation study:</b> For 2D perovskites, datasets (XRD, FTIR, etc.) directly compare the degradation pathways of lead-based (A₂PbI₄) and tin-based (A₂SnI₄) analogues, highlighting differences in chemical products and pathways.The collective data provides the foundational evidence for understanding additive functions, quantifying operational stability, and elucidating material-specific degradation mechanisms.