Data related to visual method of thickness determination for exfoliated flakes of 2D magnet semiconductor CrSBr

Name: Data related to visual method of thickness determination for exfoliated flakes of 2D magnet semiconductor CrSBr
Creator: RepOD
Published: 2024-03-18T20:49:31+08:00

RepOD Repository for Open Data2024-03-18 更新2026-07-23 收录

二维材料厚度测量

磁性半导体

数据链接：

https://repod.icm.edu.pl/dataset.xhtml?persistentId=doi:10.18150/KUQFYX 数据链接链接失效反馈

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资源简介：

Kazimierczuk, Tomasz, 2024, "Data related to visual method of thickness determination for exfoliated flakes of 2D magnet semiconductor CrSBr", https://doi.org/10.18150/KUQFYX, RepOD, V1

提供机构：

RepOD

创建时间：

2024-03-18

Data related to visual method of thickness determination for exfoliated flakes of 2D magnet semiconductor CrSBr

资源简介：

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