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Empirical Fault Patterns for Mutation Testing (Artifact)

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NIAID Data Ecosystem2026-05-02 收录
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This is the research artifact accompanying our submission "Empirical Fault Patterns for Mutation Testing". In this work we investigate how mutation testing results are affected if empirical fault patterns are used as mutation operators instead of the typical operators implemented in most mutation testing frameworks. The artifact contains the raw data we collected in a study with Defects4J and the data analysis script for processing that raw data. It also contains our implementation for the operators to be used with Coccinelle4J and the mutants we generated in our study.

创建时间:
2025-02-07
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