Data for: Microstructurally-controlled versus bulk fault gouge K-Ar dating

Supplement material 1: Description of the K-Ar and XRD methods.
Supplement material 2: Interpreted XRD diffractograms of (a) FC-1, (b) DZ-1a (c) DZ-1b, (d) FC-2, (e) DZ-2a and (f) DZ-2b.
Supplement material 3: XRD data, normalized to 100 wt%, and illite crystallinity (Kübler Index, given in Δ°2θ). Lower detection limit of XRD results is 1-2 wt% and uncertainty for quantification is c. 2-3 wt%. Kübler indices are standardized according to Warr (2018).

补充材料1：钾-氩和X射线衍射法的描述。
补充材料2：对（a）FC-1，（b）DZ-1a，（c）DZ-1b，（d）FC-2，（e）DZ-2a和（f）DZ-2b的X射线衍射图谱的解析。
补充材料3：X射线衍射数据，标准化至100重量百分比，及伊利石结晶度（根据Kübler指数，以Δ°2θ表示）。X射线衍射结果的下限检测浓度为1-2重量百分比，定量测量的不确定性约为2-3重量百分比。Kübler指数根据Warr（2018年）的方法进行标准化。