Sulfur Near Edge X-ray Fluorescence Spectroscopy Data for standard materials

DataONE2025-03-09 更新2025-04-26 收录

材料表征

行星X射线光谱学

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Sulfur Near Edge X-ray Fluorescence Spectroscopy Data for standard materials

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2025-03-09

Compositions and strains for AlInN layers compared to Vegard's rule

材料表征

外延层模型验证

Measured compositions of layers and comparison with models (Fig. 4 data); measured strains of layers and comparison with models (Fig. 6 data); measured gallium profiles near interfaces with buffer lay

DataCite Commons2020-09-18 更新60

Materials Experiment and Analysis Database: Optical spectroscopy measurements containing 112 files performed on plate containing Cr,V,Ar annealed at 610.0C to add O on 2016-05-05 from Run 20160504.192113

材料表征

光谱分析

This record is a component of the Materials Experiment and Analysis Database (MEAD). It contains raw data and metadata from millions of materials synthesis and characterization experiments, as well a

DataCite Commons2022-11-03 更新40

1,Scanning Electron Microscope Diagram 2,Transmission Electron Microscope Diagram 3,ultraviolet absorption spectrum 4,Fluorescence spectral data 5,Fourier transform infrared spectroscopy

材料表征

催化剂性能

Solid-state UV-visible diffuse reflectance spectroscopy (UV-vis DRS) measures the light absorption performance and bandgap width of catalysts. In this study, the TU-1901 instrument model was utilized

科学数据银行2024-06-28 更新20

X-ray Nanotomography and In-situ X-Ray Radiography: Wetting and Drying in Hie...

材料表征

多孔材料动态过程

We propose in-situ time- dependent X-ray radiography and nanotomography experiments on hierarchically porous silicon and silica membranes. The tomography should reveal the...

B2FIND50

Physicochemical characteristics of the test item (1% thiol-substituted HA, in physiological phosphate buffer, naturally crosslinked).

材料流变学

材料表征

Storage (G’) and loss modulus (G”) are determined at ω = 1 1/s and the ratio of viscous and elastic parts are calculated (Tan δ). Complex viscosity was also determined at ω = 1 rad/sec.

NIAID Data Ecosystem20

Sulfur Near Edge X-ray Fluorescence Spectroscopy Data for standard materials

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