SVEM Dataset: Strain–Vacancy Engineering Model for Tc Prediction in La₃Ni₂O₇ Thin Films

We present the Strain–Vacancy Engineering Model (SVEM), a phenomenological framework for predicting and controlling the critical temperature (Tc) in epitaxial La₃Ni₂O₇ thin films via coupled strain and oxygen stoichiometry tuning. Based on recent experimental observations of Tc ≈ 80 K under high pressure and Tc ≈ 26–42 K in strained films, SVEM provides a physically motivated expression:Tc(ε, δ) = Tc₀ × (1 + α·ε + β·ε²) × exp(–k_vac·δ)with parameters:• Tc₀ = 48 K• α ≈ 7–12 K/%• β ≈ –15 K/%²• k_vac ≈ 15For compressive strain ε = –10% and ultra-low oxygen vacancy concentration δ < 0.01, the model predicts Tc ≈ 95–110 K, offering a realistic pathway to enhance superconductivity in nickelates via epitaxial engineering.This dataset includes:• Parameter sweeps and simulation outputs• Experimental protocols for thin-film synthesis (MBE/PLD)• Substrate selection strategies for strain control• Annealing techniques for vacancy suppression• Validation against literature data (R² > 0.95)Keywords: Nickelate superconductors, La₃Ni₂O₇, strain engineering, oxygen vacancies, thin-film epitaxy, critical temperature enhancement