Measurements of a quantum dot thermometer using RF reflectometry
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https://research.lancaster-university.uk/en/datasets/fb032ff9-69ff-41f2-8783-6436e79019d7
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资源简介：
Data from the calibration and operation of a silicon quantum dot thermometer at temperatures between 10mK and 3K. The device is a silicon-on-insulator trigate accumulation-mode field-effect transistor from CEA/LETI-MINATEC, Grenoble, France. The device is measured using RF reflectometry to observe changes in its gate capacitance.Description
提供机构：
Lancaster University
创建时间：
2020-11-12
