Raw data for "First ptychographic X-ray computed tomography experiment at the NanoMAX beamline"
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Raw data used in "First ptychographic X-ray computed tomography experiment at the NanoMAX beamline" by M. Kahnt, S. Sala, U. Johansson, Z. Jiang, S. Kalbfleisch, F. Lenrick, J. H. Pikul and K. Thånell, submitted to the journal of applied crystallography.
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2020-03-10



