Crystallographic statistics.
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https://figshare.com/articles/dataset/Crystallographic_statistics_/945545
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资源简介：
aNumbers given in brackets are from the last resolution shell.
bRsym = (ΣhklΣi|Ii(hkl)-)/ΣhklΣIi(hkl), where Ii(hkl) is the intensity of the ith measurement of reflection (hkl) and is the average intensity.
cRmeas = (Σhkl (sqrt(Nhkl/(Nhkl-1))Σi|Ii(hkl)-)/ΣhklΣIi(hkl), where Ii(hkl) is the intensity of the ith measurement of reflection (hkl) and is the average intensity.
dRwork = (Σhkl|Fo-Fc|/ΣhklFo where Fo and Fc are the observed and calculated structure factors.
eRfree is calculated as for Rwork but from a randomly selected subset of the data (5%) which were excluded from the refinement [48].
fRamachandran et al., 1963 [49].
gI is the integrated intensity and σ(I) is the estimated standard deviation of that intensity.
创建时间：
2014-02-26
