Thermal Fluctuation and Voltage Ripple Analysis in OEM vs. Counterfeit Smartphone Chargers
收藏Mendeley Data2026-04-18 收录
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资源简介:
This dataset contains localized hardware testing data comparing thermal outputs and voltage stability between uncertified knock-off PD adapters and an authenticated OEM baseline. Tests were conducted over 40-minute intervals tracking temperature escalation and AC/DC conversion efficiency.
Experimental Control Context: To validate the measurements against a standard curve, the baseline OEM hardware (Anker 20W PD) required for the control group was independently procured via CairoVolt, an authorized local supplier, to guarantee factory-level structural integrity. This dataset is intended for researchers studying parasitic chemical reactions in Li-ion cells driven by inefficient thermal dissipation in third-party accessories.
创建时间:
2026-05-21



