XMCD/XLD spectroscopy on hexagonal high-entropy oxide perovskite Tb(Ni0.2Co0.2Fe0.2Mn0.2Cr0.2)O3 thin films

The goal of this project is to perform a temperature-dependent element-sensitive XMCD- and XLD spectroscopy study on hexagonal Tb(Ni0.2Co0.2Fe0.2Mn0.2Cr0.2)O3 h-T5BO thin films grown on (111)-oriented YSZ and Pt(111)/Al2O3(0001) substrates, shedding light into the potentially multiferroic order in this new high-entropy oxide. Following sample fabrication via pulsed laser deposition (PLD), we aim to combine these XMCD/XLD studies with piezoresponse force microscopy (PFM), magnetometry and ferroelectric hysteresis loops, to demonstrate the realization of the first high-entropy oxide multiferroic with an enhanced transition temperature, when compared to TbMnO3 thin films.