XRD analysis of vacuum-filtered MXene film - PANalytical X'Pert Pro
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An attempt is made to characterise the crystallographic texture of a vacuum-filtered Ti<sub>3</sub>C<sub>2</sub> MXene film and verify composition/purity using Rietveld refinement. <br> For full experimental details and description of uploaded data, see the uploaded .pdf.
创建时间：
2023-04-07
