Crystallographic data and Refinement Statistics.
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aRsym = |Ii−|/|Ii| where Ii is the intensity of the ith measurement, and is the mean intensity for that reflection.bRwork = |Fobs−Fcalc|/|Fobs| where Fcalc and Fobs are the calculated and observed structure factor amplitudes respectively.cRfree = as for Rwork, but for 10.0% of the total reflections chosen at random and omitted from refinement.
创建时间：
2015-12-02
