Three-dimensional in-situ imaging of single-grain growth in polycrystalline In2O3:Zr films
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Original data Here, we image a single-grain growth during the amorphous-to-polycrystalline transition in technologically relevant transparent conductive oxide (TCO) film of In<sub>2</sub>O<sub>3</sub>:Zr with <em>in-situ</em> Bragg coherent X-ray diffraction imaging. Data was obtained at 34ID-C end-station at Advanced Photon Source, Argonne National Laboratory (USA). Repository contains all raw datasets of the BCDI measurements, .spec files with corresponding meta-data, and .xlsx table with information on scan numbers related to annealing steps of the sample.
创建时间:
2022-05-09



