Power cycling test dataset (gEOL: A Gradient-based End-of-Life Criterion for Power Semiconductor Modules)
收藏DataCite Commons2023-12-01 更新2025-04-16 收录
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https://ieee-dataport.org/documents/power-cycling-test-dataset-geol-gradient-based-end-life-criterion-power-semiconductor
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资源简介：
The dataset includes on-state saturation voltage information for eight samples under four different test conditions. Each Excel file consists of two data columns: one for cycle numbers and the other for on-state saturation voltage. Although these data were collected during the power cycling test at the maximum junction temperature, the effect of temperature increase in the on-state voltage has been compensated. Namely, the provided on-state voltage has been unified to the corresponding to the respective 125°C or 150°C.More data details can be found in the article: Y. Zhang, Y. Zhang, and H. Wang, “gEOL: A Gradient-based end-of-Life criterion for power semiconductor modules,” IEEE Trans.Power Electron.
提供机构：
IEEE DataPort
创建时间：
2023-12-01
