Testings of spectrozonal analog lab-on-a-chip with angle-sensitive pixels (ASP) using diode laser sources in combined nanosecond reflectometric and stroboscopic oscilloscopic measurements.

Testings of spectrozonal analog lab-on-a-chip with angle-sensitive pixels (ASP) using diode laser sources in combined nanosecond reflectometric and stroboscopic oscilloscopic measurements. FILE 1: Combined nanosecond reflectometric and stroboscopic oscilloscopic analysis for RF lab-on-a-chip.mp400:15 - Wavelength: 405 nm (DPSS);00:57 - Wavelength: 405 nm (laser diode source); FILE 2: Analog angle-sensitive pixel lab-on-a-chip testing using nanosecond stroboscopic oscilloscope.mp400:20 - Zero Point Calibration (ZPC);00:34 - R-channel calibration;01:01 - R-channel in pulse regime;01:37 - R-channel; laser measurements in darkfield conditions;02:17 - reversive transitions reflectometry in nanosecond time range (and more);02:30 - B-channel; 405 nm laser diode source;02:54 - strobiong regime exit Acknowledgements:“Development of the novel physical methods for complex biomedical diagnostics based on position-sensitive mapping with the angular resolution at the tissue and cellular levels using analytical labs-on-a-chip” (RFBR grant # 16-32-00914) [6 838,27 $ per year];“Lab-on-a-chip development for personalized diagnostics” (FASIE grant 0019125) [3 039,00 $ per year].