Dataset of Analysis of Cu-Associated Defects in Silicon through Lifetime Spectroscopy
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资源简介：
This dataset contains the experimental data presented in the poster ''"Analysis of Cu-Associated Defects in Silicon through Lifetime Spectroscopy", which was showed at EUPVSEC25 (42nd European Photovoltaic Solar Energy Conference and Exhibition). The data were collected and processed using Origin, including measurements relevant for detection of Cu-associated defects in silicon.
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Zenodo创建时间：
2026-01-21
