20215021

In this proposal we aim to study the lattice dynamics of the copper-based MOF Cu-INA in the bulk and in thin film phases by detecting their IR active lattice phonon modes in the far-IR region. The data obtained in this investigation will complement the study of the Raman active lattice phonon modes measured in a lab-based setup. This proposal is part of a larger project, that has the overall goal of solving the unknown crystal structures of MOF phases formed during thin film processing. The crystal structure solution for MOF thin films will start from the concepts developed for molecular crystal thin films, based on Grazing Incidence X-ray Diffraction (GIXD). The complementary measurements of the IR and Raman active lattice phonons, combined with the theoretical simulation of the vibrational spectra (which are crucially impacted by structural details), will allow us to verify the correct interpretation of the X-ray data. The use of the ELETTRA setup will give us access to the far-IR region not available in the usual lab-based instrumentation and the high brightness of the synchrotron radiation will enhance the signal from the thin films.