3D chemical characterization of frozen hydrated hydrogels using ToF-SIMS with argon cluster sputter depth profiling
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下载链接：
https://rdmc.nottingham.ac.uk/handle/internal/61
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资源简介：
Data storage of 3 ToF-SIMS depth profiles of frozen-hydrated hydrogels as required by the EPSRC data deposit requirement
提供机构：
University of Nottingham
创建时间：
2016-09-20
