Test of Neutron Effects On Commercial Off The Shelf Microcontroller
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https://b2find.eudat.eu/dataset/f9f6aae0-6133-5344-9156-fb0166d0871b
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The goal of this experiment is to characterize the SEU occurrence on a Microcontroller caused by neutrons. We will focus on a COTS component, in order to evaluate its robustness...
