Test of Neutron Effects On Commercial Off The Shelf Microcontroller

The goal of this experiment is to characterize the SEU occurrence on a Microcontroller caused by neutrons. We will focus on a COTS component, in order to evaluate its robustness...本实验旨在表征中子诱发微控制器（Microcontroller）上单粒子翻转（Single Event Upset，SEU）的发生特性。本次研究将聚焦于一款商用现货（Commercial Off-The-Shelf，COTS）组件，以评估其鲁棒性……