Scanning diffraction microscopy from InGaN pseudo-substrates
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The objective of this study is to obtain a microscopic mapping of the full tensors of strain and lattice orientation of an In-enriched InyGa1-yN layer on porous...
本研究旨在获取多孔上富铟铟镓氮(InyGa1-yN)层的应变与晶格取向全张量的微观映射图谱。



