SEM & EDX (Zeiss Sigma) of MXene nanoparticles
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资源简介：
Reduced accelerating voltage (≤ 10 kV) EDX is used in combination with secondary electron imaging in an attempt to reduce sub-surface/substrate X-ray emission and confirm nanoparticle presence. See uploaded .pdf for full experimental details.
创建时间：
2023-03-13
