Data for: Information Depth in Backscattered Electron Microscopy of Nanoparticles Within a Solid Matrix
收藏Mendeley Data2018-02-09 更新2026-04-09 收录
下载链接：
https://data.mendeley.com/datasets/hrh6m7zswn/1
下载链接
链接失效反馈官方服务：
资源简介：
This file contains: Simulated line scans of the backscattered electron signals obtained from Monte Carlo simulations for different nanoparticle sizes, depth and accelerating voltages (used for Figure 4) Experimental diameters measured from SEM and TEM micrographs
创建时间：
2018-02-09
