OPC10M High-Voltage Optocoupler Test Data
收藏科学数据银行2025-12-11 更新2026-04-23 收录
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资源简介:
It includes the data generated during the reliability test of a batch of OPC10M devices produced in 2024,covering the temperature characteristics of device leakage current; test data of junction voltage; post-temperature-cycle test failure data; comparison of test data before and after the service life; and monitoring data of photocurrent during the service life period.
提供机构:
国家空间科学中心
创建时间:
2025-12-11



