OPC10M High-Voltage Optocoupler Test Data
收藏官方服务：
资源简介：
It includes the data generated during the reliability test of a batch of OPC10M devices produced in 2024,covering the temperature characteristics of device leakage current; test data of junction voltage; post-temperature-cycle test failure data; comparison of test data before and after the service life; and monitoring data of photocurrent during the service life period.
提供机构：
国家空间科学中心创建时间：
2025-12-11
