Raw data: Characterization of nanocrystallised multilayered metallic materials produced by the SMAT followed by constrained compression
收藏Mendeley Data2018-07-16 更新2026-04-09 收录
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https://data.mendeley.com/datasets/z488ggd2r8/1
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资源简介：
Optical, SEM, TEM images. EDS analysis.
创建时间：
2018-07-16
