XPS spectrum for carbon materials derived from coffee ground
收藏Mendeley Data2024-06-25 更新2024-06-27 收录
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https://repod.icm.edu.pl/citation?persistentId=doi:10.18150/R56X97
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资源简介：
The surface element composition of samples was characterized by means of X-ray photoelectron spectroscopy (XPS) (VGESCALAB MKII spectrometer using an Al Kα exciting radiation from an X-ray source operated at 10.0 kV and 10 mA). The survey scanning mode was carried out to obtain the low-resolution spectra (0–1200 eV) while the XPSPEAK 4.1 software was applied to further deconvolute the high-resolution C1s spectra (282–292 eV) into four carbon-related Gaussian peaks.
创建时间：
2023-06-28
