Synchrotron Micro-Tomography of NMC811 Particles

3D tiff stacks of tomographic data used within "Non-Linear Damage Response to Voltage Revealed by Operando X-ray Tomography in Polycrystalline NMC811". Within this dataset is a series of 3D tiff stacks that contain tomograms from I13-2 at Diamond Light Source, with a spatial resolution of 325 nm using a pco.edge.5.5 CMOS full field X-ray detector. The NMC811 particles are taken at multiple states-of-charge during the first charge cycle, and using a particle grey level analysis algorithm we have looked to understand the cracking behaviour on a particle-by-particle basis.