X-Ray Reflectivity of chips for quantum application

We will be measuring X-ray reflectivity of various samples that have quantum applications. These sample consist of stacked films with different thickness on Si substrate. We will be using new lenses of ID31 to achieve submicron beamsize. With this capability, we hope to determine the precise thickness and more importantly, the roughness of the different interfaces. Obtaining insights of these interfaces is crucial for the quantum chips industry.