Crystal quality analysis of SAG PbTe/CdTe heteroepitaxy for Majorana quantum bit applications

This proposal aims to examine the crystal quality of heteroepitaxial selective area grown (SAG) PbTe on CdTe using molecular beam epitaxy. PbTe is a promising material for detecting Majorana bound states, which are essential for fault-tolerant quantum bits. However, high-quality, low disorder heteroepitaxy is required to achieve this. Scanning X-ray diffraction microscopy at the ID01 beamline will be employed to analyse strain and rotation distributions in PbTe samples. Our findings will address key aspects like mask constriction, crystal reorientation during growth, and lattice mosaicity on the quality of PbTe nanowire networks.