Prognostics Of Power Mosfets Under Thermal Stress Accelerated Aging Using...
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https://data.nasa.gov/dataset/prognostics-of-power-mosfets-under-thermal-stress-accelerated-aging-using-data-driven-and--3f82a
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An approach for predicting remaining useful life of power MOSFETs (metal oxide field effect transistor) devices has been developed. Power MOSFETs are semiconductor switching...
