Synchrotron data - Ryan 6686 (July 2013) - Characterization of elemental efficiency and resolution for Maia Quantitative imaging at XFM

The success of XFM equipped with Maia to provide outstanding high-definition element images for a host of user applications is tempered a little by count-rate induced peak shifts that can cause subtle spectra distortion that frustrate spectrum fitting and produce mixing artefacts between elements. This experiment aims to complete the systematic
calibration and characterization begun in M4271 with the addition of count-rate effects characterization with the aim to correct these effects for better peak stability and energy resolution and improved quantitative imaging. This user instrumentation physics experiment will directly benefit all users of the XFM Maia facility.