Sample data for X-ray visualization of local bending of the lattice planes (XR-V-LBLP)

We have improved synchrotron X-ray diffraction imaging, a type of X-ray diffraction topography (XRDT), and have proposed a new method to visualize the local bending of lattice planes (XR-V-LBLP). Data can be used to perform calculations for the proposed method. Data contain two or more reflections at different azimuthal angles of the sample, and each azimuthal data contains two-dimensional diffraction images of the substrate obtained by rotating the angle of incidence. Please see the attached file for more details.