Angle-resolved optical spectroscopy data on MePTCDI/hBN: experiments and simulations

angle_resolved_spectroscopy.hdf5: contains experimental angle-resolved reflectivity and photoluminescence measurements carried out at the SupraFAB building, Freie Universität Berlin, for MePTCDI molecules grown on hBN flakes of different thicknesses. For the angle-resolved reflectivity data, simulations corresponding to the experimental parameters are also included. angle-resolved photoluminescence data of MePTCDI on hBN flakes for five thicknesses. For the 45 nm flake, additional polarization-resolved data are available (Figure 3 in the corresponding paper) angle-resolved reflectivity data of MePTCDI on hBN flakes for five thicknesses: experiments and corresponding simulated spectra simulations_angle_resolved_reflectivity.hdf5: contains simulated angle-resolved reflectivity data carried out using the PyGTM code (https://pygtm.readthedocs.io/en/latest/), based on Passler, N. C. and Paarmann, A., JOSA B 34, 2128 (2017) 10.1364/JOSAB.34.002128. calculated hBN thickness dependence of the p-polarized angle-resolved reflectivity spectra, for a fixed SiO2 thickness of 290 nm calculated SiO2 thickness dependence of the p-polarized angle-resolved reflectivity spectra, for a fixed hBN thickness of 121 nm additional hBN thickness dependence of the p-polarized angle-resolved reflectivity spectra, focusing on a "sharp feature" appearing