Atomic Layer Engineering of Aluminum doped Zinc Oxide Films for Efficient and Stable Perovskite Solar Cells

The effect of deposition sequence in the atomic layer deposition process of aluminum doped zinc oxide films on the performance and stability of perovskite solar cells is investigated. This data set contains the optoelectronic (UV-Vis, UPS) and compositional characterization of the resulted thin films (XRD, SEM) and photovoltaic properties of the fabricated solar cells (J-V curves, carrier recombination, power conversion efficiency, hysteresis effect). The resulted perovskite films were also characterized by steady-state photoluminescence (PL) and time-resolved PL (TRPL) measurements.