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X-ray Excited Optical Luminescence (XEOL) -detected XAFS investigation of the structure and electronic properties of photochromic/photolumin

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DataCite Commons2025-03-01 更新2025-04-15 收录
下载链接:
https://doi.esrf.fr/10.15151/ESRF-ES-2009540272
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The goal of this proposal is to use X-ray excited Optical Luminescence (XEOL)-detected X-ray absorption Fine Structure (XAFS) to investigate the electronic and structural properties of a series of novel selenium-based hackmanite materials displaying remarkable photoluminescent (including long-persistent luminescence) and photochromic properties, as a function of the selenium content and halogen (Cl-, Br-, I-) coordination. XEOL-XAFS recorded simultaneously with conventional transmission XAFS will provide enhanced selectivity facilitating and discriminating the structure determination between the luminescent and photochromic species. This investigation will provide a better understanding of the selenium species structure-to-luminescence/photochromism relationship focusing on Se interaction with the different halogen anions present in their environment and with the template framework and contribute to rationalize the design of new phosphors for LED and photodetector applications.
提供机构:
European Synchrotron Radiation Facility
创建时间:
2025-03-01
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