Using Scalable Computer Vision to Automate High-throughput Semiconductor Characterization
收藏DataCite Commons2026-01-07 更新2025-04-16 收录
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https://service.tib.eu/ldmservice/dataset/9f030a97-8a30-4a10-8505-ecce4cf266be
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High-throughput materials synthesis methods have risen in popularity due to their potential to accelerate the design and discovery of novel functional materials, such as solution-processed semiconductors. After synthesis, key material properties must be measured and characterized to validate discovery and provide feedback to optimization cycles.
提供机构:
TIB
创建时间:
2024-12-16



