Quantifying Flat-Band Voltage in Si Metal-Oxide-Semiconductor Structures- An Evaluation via Terahertz Emission Spectroscopy (TES) dataset

Name: Quantifying Flat-Band Voltage in Si Metal-Oxide-Semiconductor Structures- An Evaluation via Terahertz Emission Spectroscopy (TES) dataset
Creator: figshare
Published: 2025-05-13T03:22:20+08:00

DataCite Commons2025-05-13 更新2025-09-08 收录

半导体物理/物理学

太赫兹光谱

数据链接：

https://figshare.com/articles/dataset/Figure_2_opju/29043638 数据链接链接失效反馈

官方服务：

资源简介：

The calculation dataset of Figure.2 in the titled journal paper: Quantifying Flat-Band Voltage in Si Metal-Oxide-Semiconductor Structures- An Evaluation via Terahertz Emission Spectroscopy (TES)

提供机构：

figshare

创建时间：

2025-05-13