Scanning electron microscopy (SEM) images of the boron-dopied carbon nanowalls surfaces

The dataset contains the scanning electron micrographs (SEM), revealing the surface morphology of boron-doped carbon nanowalls electrodes on silicon substrates. The surface is characterized by nano-walled structures. The obtained electrodes were doped with boron at the level of [B]/[C] = 1200ppm in the gas atmosphere during the synthesis. The selected micrographs were utilized when preparing the manuscript published in Advanced Materials Interfaces: DOI 10.1002/admi.202100464