Research data for "Influence of GaN substrate miscut on the XRD quantification of plastic relaxation in InGaN" published in Acta Materialia vol 276, 120082 (2024)
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https://repod.icm.edu.pl/citation?persistentId=doi:10.18150/ZYX2FD
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资源简介：
The data contains original cathodoluminescence and transmission electron microscopy images used to construct the figures in this article. The data also contains original X-ray diffraction data used to construct X-ray maps.
提供机构：
RepOD
创建时间：
2024-09-16
