X-ray crystallographic data collection and structure refinement statistics.
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†Rsym = ΣΣj|Ij -I>|ΣIj, where Ij is the intensity measurement for reflection j and I> is the mean intensity for multiply recorded reflections.‡R = Σ||Fobs| - |Fcalc||/Σ|Fobs|, where the working and free R factors are calculated by using the working and free reflection sets, respectively. The free R reflections (5% of the total) were held aside throughout refinement.
创建时间：
2015-12-02
