Thermally Evaporated Deep-Blue Random Lasing in CsPbCl3 Perovskite Film for Speckle-free Imaging
收藏DataCite Commons2025-12-02 更新2026-05-05 收录
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The photoluminescence spectrum was tested using a confocal microscopy system equipped with a 405 nm continuous laser. Characterization of the crystal structure of perovskite thin films using X-ray diffractometer. The surface morphology of the thin film was observed by field emission scanning electron microscopy, and the sample surface was treated with platinum sputtering before testing. Characterize the surface morphology and roughness of thin films using atomic force microscopy in alternating current mode. All data were plotted using Origin processing.
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Science Data Bank
创建时间：
2025-12-02
